[GSAS-II] delta d over d vs Q for constant wavelength and TOF

[Magnus Moe Nygård]

Dear all.

Does anyone know how to obtain the instrument resolution function (delta d/d) as a function of scattering vector Q from a Rietveld refinement performed on a standard sample (i.e. LaB6, Si, Ni, etc.) for both the constant wavelength case and for time-of-flight (TOF)?


Best wishes,
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Magnus Moe Nygård
PhD-student
Institute for Energy Technology, Neutron Materials Characterization (NØYTRON)
Instituttveien 18, P. O. Box 40
NO-2027 Kjeller
Phone: (+47) 41 42 66 26
www.ife.no<http://www.ife.no/>

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