[GSAS-II] Different profiles for different phases

[Bartłomiej Gędziorowski]

Hello Everybody,

first of all I'd like to say hello to everybody, because this is my 
first post in this list. My name Is Bartłomiej Gędziorowski, I work at 
AGH UST in Cracow, Poland and I'm a materials scientist.

I worked few years with GSAS+EXPGUI, now from some time I'm migrating to 
GSASII and I cannot find one feature. It is the setting of different 
profile sets for different phases for a single histogram. I have a 
sample in form of a thin layer on a beryllium substrate. As a result on 
diffractograms I can see both my material reflections, quite wide 
because of sub-micron grains, and very thin beryllium. This causes a 
problem, because I cannot find suitable set of profile values for 
double-phase refinement. I worked it around putting beryllium 
reflections in the background, but that's not a good solution for me. 
The beryllium peaks are very helpful, because they allow to precisely 
fit sample displacement - we use special in-situ cell in which placing 
sample in right position is challenging and we always have some shift. 
For that reason it would be perfect to do a double-phase fit.

I would be grateful for some suggestions how to solve my issue.

Best regards,

-- 
Bartłomiej Gędzioroski, Ph.D.
AGH University of Science and Technology,
Faculty of Energy and Fuels,
Department of Hydrogen Energy,
al. Mickiewicza 30
30-059 Krakow, Poland